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化学工业与工程 2019, Vol. 36 Issue (3) :8-15    DOI: 10.13353/j.issn.1004.9533.20181025
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高温原位XRD法研究含硅杂质TiO2的煅烧相变机理
魏炎斌, 徐本军, 罗弦, 龙永富
贵州大学材料与冶金学院, 贵阳 550025
Phase Transition Mechanism of Calcined Titanium Dioxide Containing Silicon by High Temperature In-Situ X-ray Diffraction
Wei Yanbin, Xu Benjun, Luo Xian, Long Yongfu
College of Materials and Metallurgy, Guizhou University, Guiyang 550025, China

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摘要 为了揭示Si杂质元素对TiO2相变机理的影响,通过TiCl4水解法制得Si摩尔分数为10%的H2TiO3和H4SiO4的金红石中间体,用DTA-DTG,XRD研究TiO2在Si元素作用下的高温相变过程。结果发现,掺杂Si(10%)元素的TiO2是在650℃开始由无定形结构转变为锐钛矿相,1 000℃时由锐钛矿相转变为金红石相。结果表明:与纯的TiO2相变温度相比,掺杂Si元素抑制了TiO2由无定形到锐钛矿相及锐钛矿相到金红石相的转变温度;同时发现随着高温时间的增加TiO2同种晶型结晶性变化规律。
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魏炎斌
徐本军
罗弦
龙永富
关键词TiO2      热处理   晶型转变     
Abstract: In order to reveal the influence of Si impurity elements on the phase transformation mechanism of titanium dioxide, rutile intermediates of H2TiO3 and H4SiO4 doped with Si (10%) were prepared by TiCl4 hydrolysis method. The high temperature phase transition of TiO2 under the effect of doped-Si was studied by DTA-DTG and XRD. As a result, it was found that the Si(10%) doped TiO2 was transformed from an amorphous structure to an anatase phase at 650℃, and changed from an anatase to a rutile phase at 1 000℃. The results show that compared with the pure TiO2 phase transition temperature, the doping of Si inhibits the transformation temperature from amorphous to anatase and anatase to rutile. At the same time, it was found that with the increase of the high temperature time, the crystallinity of the same crystal form of titanium dioxide changes.
Keywordstitanium dioxide;   silicon;   heat treatment;   crystal transformation     
Received 2018-05-02;
Fund:国家自然科学基金项目(51664004)。
Corresponding Authors: 徐本军,E-mail:11793736@qq.com。     Email: 11793736@qq.com
About author: 魏炎斌(1991-),男,硕士研究生,现从事有色金属冶金方面的研究。
引用本文:   
魏炎斌, 徐本军, 罗弦, 龙永富.高温原位XRD法研究含硅杂质TiO2的煅烧相变机理[J].  化学工业与工程, 2019,36(3): 8-15
Wei Yanbin, Xu Benjun, Luo Xian, Long Yongfu.Phase Transition Mechanism of Calcined Titanium Dioxide Containing Silicon by High Temperature In-Situ X-ray Diffraction[J].  Chemcial Industry and Engineering, 2019,36(3): 8-15
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